Scanning Electron Microscope (SEM) is a type of electron microscope that produces images of a sample surface by scanning samples with a focused beam of electrons. The JEOL JSM-5410 SEM in our lab is capable of imaging sample surface morphologies by using secondary electrons or back-scattered electrons, equipped with an Energy Dispersive X-ray Spectrometer (EDS) for chemical analysis. With robust W filament, the SEM is capable of characterizing different materials, such as semiconductive, geological, biological, and composite materials.
Specifications and capabilities of JSM-5410 SEM
- Resolution: 3.5 nm (Accv. 30 kV, WD = 6 mm, secondary electron image)
- Magnification: x15 (WD = 48 mm) to 200,000 (25 steps)
- Image modes:
- Secondary electron image (SEI) HV Mode
- Backscattered electron image (BEI) HV Mode
- Backscattered electron image (BEI) LV Mode
- Accelerating voltage: 0.5 to 30 kV
- EDAX Genesis Software: Point, line, and area EDS analysis as well EDS mapping
User Rates
Rates will be based on an hourly or per sample basis and will be decided after consultation with the customer.
Assisted Use: $20/hr.*
Training: $25/hr.
Self-Use: $10/hr.
Consumables charged at cost.
Contact Us
Dr. Weilie Zhou
Email: wzhou@uno.edu
Sample Data
