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Structural Characterization

  • Transmission Electron Microscope (TEM), JEOL Model 2010 with energy dispersive X-ray spectrometer (EDS)
  • Scanning Electron Microscope (SEM), JEOL Model 5410 with energy dispersive X-ray spectrometer (EDS)
  • Field Emission Scanning Electron Microscope (FESEM), Model LEO 1530VP, variable pressure FESEM with EDS
  • Asylum Research Atomic Force Microscope/Magnetic Force Microscope equipped for piezoelectric measurements
  • Princeton Instruments Trivista triple spectrometer (Raman, FTIR, Photoluminescence)
  • Pananalytical Thin film/Small Angle X-Ray Diffraction (SAXS)
  • Digital Instruments NanoScope Multimode Scanning Probe Microscope with combined atomic force microscopy, magnetic force microscopy and scanning tunneling microscopy
  • VEECO Scanning probe microscope
  • Philips X’Pert X-ray powder diffractometer
  • BX51TRF Microscope frame w/o TL arm w/2 sockets for patterning and wafer checking
  • DEC Alpha Workstation for EM image simulation, processing and storage.